Themes and Goals

The Testing: Academic and Industrial Conference 2009 (TAIC PART 2009) establishes a forum for the publication of papers related to software testing and analysis. The theme of TAIC PART is transferring software testing technology from academia to industry. TAIC PART aims to forge collaborations between industry and academia. The goals of TAIC PART 2009 include the articulation of fundamental research questions in the field of software testing and analysis. TAIC PART also focuses on the practical challenges that are often faced by software developers in industry.

Call for Papers

TAIC PART 2009 solicits experience, tool, original research, industry challenge, academic challenge, and fast abstract papers that explore software testing and analysis techniques. Research topics include, but are not limited to, the following areas:

TAIC PART solicits papers that focus on the testing and analysis of software applications that include, but are not limited to, the following types:

Types of Papers

Paper Evaluation

All papers will undergo a rigorous examination by at least three members of the program committee. The program co-chairs and the program committee will provide thoughtful and fair reviews that furnish detailed insights into ways for improving and extending the papers. All submitted papers will be evaluated according to (i) relevance to the conference themes and goals and (ii) clarity and organization.

The results described in the submitted paper must be unpublished and should not be under review at other workshops, conferences, or journals.

Paper Formatting

Papers should be formatted using the IEEE conference style format. Including all references and figures, a research paper must not exceed the ten page limit and the experience, tool, and industry and academic challenge papers should be not longer than five pages. Finally, fast abstract papers must be two pages in length. Authors should submit a PDF version of their paper through the Submit Paper Web site.

Conference Proceedings

The accepted papers will be published with ISBN by Conference Publishing Services (CPS) and they will appear in the IEEE digital library. A special issue of the Journal of Systems and Software will also publish revisions of selected papers from TAIC PART 2009.

Additional Resources